Multilayer Reflecting sample using matrix Formula, v2 with ’nrepeats’ for repeating multilayer structure.
Author: Robert Dalgliesh
Origin: ISIS
Date: June 2010
in order to get this to compile you need to link against the gsl and gslcblas libraries.
to do this automatically edit /usr/local/lib/mcstas/tools/perl/mcstas_config.perl
add -lgsl and -lgslcblas to the CFLAGS line
Horizontal reflecting substrate defined by SLDs,Thicknesses, roughnesses The superphase may also be determined
Example: Multilayer_Sample(xmin=-0.1, xmax=0.1,zmin=-0.1, zmax=0.1, nlayer=1,sldPar={0.0,2.0e-6,0.0e-6},dPar={20.0}, sigmaPar={5.0,5.0})
Example: d1 500: sld1 (air) 0.0: sld2 (Si) 2.07e-6: sldf1(film Ni) 9.1e-6
Parameters in boldface are required; the others are optional.
|
Name |
Unit |
Description |
Default |
|
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|
xwidth |
m |
Width of substrate |
0.2 |
|
zlength |
m |
Length of substrate |
0.2 |
|
nlayer |
1 |
Number of film layers |
1 |
|
nrepeats |
1 |
Number of repeats of the block of layers appart from the superphase and substrate |
1 |
|
sldPar |
Å\(^{-2}\) |
Scattering length Density’s of layers |
{0.0,2.0e-6,0.0e-6} |
|
dPar |
Å |
Thicknesses of film layers |
{20.0} |
|
sigmaPar |
Å |
r.m.s roughnesses of the interfaces |
{5.0,5.0} |
|
frac_inc |
1 |
Fraction of statistics to assign to incoherent scattering |
0 |
|
ythick |
m |
Thickness of substrate |
0 |
|
mu_inc |
m\(^{-1}\) |
Incoherent scattering length |
5.62 |
|
target_index |
1 |
Used in combination with focus_xw and focus_yh to indicate solid angle for incoherent scattering. |
0 |
|
focus_xw |
m |
Used in combination with target_index and focus_yh to indicate solid angle for incoherent scattering. |
0 |
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Component source code found in file Multilayer_Sample.comp.